Characterization
Explore, analyze, understand your materials and devices
This pole is entirely dedicated to the advanced characterization of materials and devices.
Our cutting-edge equipment allows for the study of material properties in various forms: bulk, in solution, as thin films, or integrated into various types of devices.
The objective is to provide an in-depth understanding of the electrical, optical, structural, and morphological properties of the samples. Rheological and elemental analyses can also be performed according to your project’s needs.
Our Characterization Techniques and Equipment
We provide you with a wide range of equipment covering the main analytical approaches :
- SEM / TEM: Scanning and Transmission Electron Microscopy
- TF Analyzer: Measurement of dielectric and ferroelectric properties
- Profilometer: Topographical characterization and layer thickness measurement
- 4-point probe: Conductivity measurements of films and devices
- XPS / UPS: Photo-electron spectroscopies
- Optical Microscope
- Spectroscopy
See the list of all our characterization equipment
Two possible access modes
01
Autonomous Use
Access our equipment autonomously after validation of your training and technical skills. Our infrastructures are designed to offer a safe, high-performance, and flexible environment for your research or development needs.
02
Service Provision with Detailed Report
Entrust us with your samples and let our engineers and technicians carry out the measurements for you. A complete and interpreted report will be provided to you, including experimental conditions, raw results, and main analysis conclusions.